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Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact
Springer Series in Materials Science Book 270
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CMOS Past, Present and Future
Woodhead Publishing Series in Electronic and Optical Materials
ByBindingKindle EditionBrandWoodhead PublishingFormatKindle eBookRelease Date2018-04-03 -
Random Telegraph Signals in Semiconductor Devices
IOP Expanding Physics
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BindingKindle EditionBrandElsevierFormatKindle eBookRelease Date2011-07-28 -
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Extended Defects in Germanium: Fundamental and Technological Aspects: 118
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